Page 545 - Mahr马尔量具完整

MarSurf VD 140 / VD 280

Roughness and Contour Measuring Station

DESCRIPTION

MarSurf VD Series - The MarSurf
family is complemented:
The easy change between rough-
ness and contour tracing system
Depending on the measuring task,
either the BFW roughness probe
system for surface roughness or
the C 11 contour probe system
for contour measurements can be
changed by the operator (hot-plug
capable). The new system offers
the advantages of combining the
highly dynamic C 11 contour probe
system with the high-precision BFW
probe system, which is particularly
suitable for fine surfaces.
The new measuring station concept
combines speed, reli ability and
flexibility.
The aim is to increase the TECHNICAL DATA
profit ability of the system for
your company. MarSurf VD 140 / 280
The measuring stations are Measuring range with probe system BFW 250
operated with the user-friendly 500 µm (±250 µm) for probe arm length 45 mm
MarWin software (MarWin Easy 1500 µm (±750 µm) for probe arm length 135 mm
Roughness & Contour or MarWin
Professional Roughness & Contour). with probe system C 11
70 mm with probe arm length 350 mm
max. 100 mm with probe arm length 490 mm
Innovative technologies:
• Fast axes Guide deviation 0.07 µm / 20 mm (with probe system BFW 250)
0.35 µm / 60 mm
• Positioning speeds up to 200 0.4 µm / 140 mm
mm/s in X Measuring speed Up to 10 mm/s
• Contour measurements are 25 x
faster than with its predecessor Positioning speed 0.02 – 200 mm/s (in X)
MarSurf PCV or MarSurf CD 120
• Surface measurements are 40 x Roughness probe system BFW Innovative workpiece clamping system
faster than with the MarSurf • Easy probe arm change and probe arm protection by • Mounting plate 390 x 430 mm with hole
GD 120 means of magnetic probe arm holder dimension 50 mm
• By default, the Z-axis is fully • Probe arm mount allows the change from standard to • Integrated 60 mm TY adjustment
CNC-capable transverse measurement without tools or adapter • The combination of mounting plate and integrated TY
• The Z-axis is approx. twice as fast • Extensions for the probe system possible adjustment makes an additional XY table superfluous
as previous Mahr Z-axes • Low workpiece setup supports a favorable short
• Up to 5 times faster than measurement loop, which has a positive effect on t
standard Z-axes on the market he measurement results

Two reference probe systems for
your measuring tasks APPLICATIONS ACCESSORIES
Contour probe system C 11
• Probe arm recognition via Machine building Optional
inte grated chip • Bearings, threads, threaded rods, ball screws, • Manual control panel with joystick and display
• Standard measuring range up to shafts, racks • Motor-driven TY axis
70 mm; Max. 100 mm with 490 • Parallel vice
mm probe arm length Metrology close to production • Prism block
• Magnetic probe arm holder, • Contour measurement in a semi-automatic process • Equipment table
probe arm change without tools • Vibration damping system
• The touch probe combines Automotive industry
robustness with dynamics • Steering, brake system, gearbox, crankshaft, General software options
• Optional: Possibility to extend camshaft, cylinder head • Option - MeasurementPlus
the roughness value • Option - RoughnessPlus
determi nation to contours Medicine • Option - ContourPlus
• Contour measurement for hip and knee • Option - Dominant Waviness (WDc) for MarWin
endoprostheses, medical screws, dental implants • Option - ISO 13565-3 surface parameters
• Option - QS-STAT / QS-STAT Plus
• Option - Profile processing
• Option - User-defined parameters
• Option - Topography

For more information, please visit our website: www.mahr.com

MarSurf | Surface Measuring Instruments 541