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MarOpto TWI 60

Tilted Wave Interferometer

DESCRIPTION

Tilted Wave Interferometer for the quick and flexible measurement
and analysis of aspherical lenses.
The Tilted Wave Interferometer (MarOpto TWI 60) is a new and highly
flexible interferometer for the quick and high precision measurement of
aspheres.
The second picture shows the surface deviations measured in the A5
demonstrator asphere (free aperture 50 mm, best fit radius 40.8 mm, devi-
ation from best-fit sphere 600 µm, gradient deviation 8°).
The lateral resolution is approx. 30 µm. During the data acquisition time of
approximately 30 seconds, the entire surface of the asphere is measured
at a high lateral resolution and with low measurement uncertainty. Most
importantly, neither a CGH (Computer Generated Hologram) nor stitching
is required.

FEATURES
• Flexible interferometric measurements of aspherical lenses without CGH
• Measurements without the need for stitching
• Short data acquisition time of approximately 30 s
• Beam diameter 100 mm
• Permitted aspherical deviation compared to a best-fit sphere
approximately 1.5 mm

Measured surfaces defects as well as the form deviation of an asphere
with MRF footprints

For more information, please visit our website: www.mahr.com

MarOpto | Measuring Instruments for the Optical Industry 587