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MarSurf CWM 100

        3D Surface Measurement

        DESCRIPTION

        The multi-measurement solution
        MarSurf CWM 100 is a precise
        optical measuring instrument with
        sub-nanometer resolution combin-
        ing a confocal microscope with a
        white light Interferometer.
        Key benefits:
        •  Highest precision with sub-
          nanometer resolution
        •  Universal suitability for technical,
          optical and reflective surfaces.
          Also for surfaces of printed
          circuit boards and semiconductor
          products as well as biological
          tissues
        •  2D surface analysis and
          measuring evaluations
        •  Topographic 3D surface analysis
          and measuring evaluations  TECHNICAL DATA
        •  Intelligent measuring strategies
          - fast measurements –    CWM 100
          short measuring times    Measuring principle              By interferometer, by white light interferometer and confocal
        •  Microscope image field sizes,                                   Light source (CM and WLI): LED, 505 nm
          easily expandable by fully   Measuring range                Sensor unit can be moved 100 mm in Z, CNC controlled
          automatic stitching                                      Object table can be moved 100 mm in X and Y, CNC controlled
        •  Automatic table or object
          positioning: 100 mm x 100 mm,                                   Interferometer, white light interferometer:
          longer distances on request                         Measuring range (WLI): More as 4 mm (Standard mode), more as 20 mm in ex-
        •  A wide range of lenses allows for                                       tended mode
          an ideal adaptation to the                                             Confocal microscope:
          measurement object                                  Measuring range (CM): more than 12 mm (depending on resolution in Z and lens)
        •  Solid construction with granite
          base plate and granite column
          for the best possible vibration   APPLICATIONS                   ACCESSORIES
          damping
                                  Mechanical Engineering                   Optional:
        Supplied with:            •  To qualify and quantify roughness, geometry   •  CT 120 two-axes tilting table
        •  Sensor system consists of:  and wear volume                     •  Tilting table for large angles  +/– 30°
          -  Confocal microscope & WLI                                     •  Set of standards
           with 6x nosepiece      Electronics and semiconductors           •  WLI Objective lenses: 2.5x0.075; 5x0.13; 10x0.3;
          -  Camera, 780 x 580 pixels, up   •  Component inspection down to the   20x0.4; 50x0.55; 100x0.7
           to 48 images/s (standard   sub-micrometer range for defect-free products   •  Confocal microscope objective lenses: 10x0.3; 10x0.5;
           version)                                                          20x0.4; 20x0.75;50x0.6; 50x0.8; 100x0.9
          -   100 mm CNC controlled Z axis   Medical Technology            •  MarSurf MfM for professional evaluation, graphical
           with integrated Heidenhain   •  Quality assurance of medical surfaces in   representation and creation of measuring records
           glass scale              production and laboratory                (choice of Standard, Extended or Premium Version)
        •  One operating software with                                     •  Active vibration isolation system (for optimum damp-
          WLI and confocal software   Material Science                       ing for measurements in the nanometer and sub-
          modules                 •  Optimization of functional properties of   nanometer range
        •  Granite base frame and column   new surfaces and products
          with sensor system and CNC
          controlled object table  Microsystems Technology
        •  CNC controled motorized Z axis   •  Measure complex surface geometries of smallest
          and XY table for probe position-  components with nanometer precision
          ing and image field merging
        •  Lenses (optional)
          -  4x to 150x (confocal
           microscope)
          -  2.5x to 100x (white light
           Interferometer)









                                         For more information, please visit our website: www.mahr.com

                                                            MarSurf | Surface Measuring Instruments            553
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